These open-source MMM tools solve different measurement problems, from budget optimization to forecasting and preprocessing.
Abstract: The Wafer Acceptance Test (WAT) is a significant quality control measurement in the semiconductor industry. However, because the WAT process can be time-consuming and expensive, sampling ...
Abstract: This study focuses on the anomaly detection problem in Network Security Situational Awareness (NSSA). We systematically review traditional approaches and recent advancements based on Machine ...