Physical examination involves visual checking of goods to verify the nature, properties, origin, condition and quantity to ensure proper customs valuation, tariff classification and ...

As companies manufacture goods, human inspectors review them for defects. Think of a scratch on smartphone glass or a weakness in raw steel that could have an impact downstream when it gets turned ...

Over the last several years, China’s PV industry has developed rapidly, its newly installed capacity ranking first in the world for 8 consecutive years. The time is right for the integration of smart ...

IBM on Tuesday is launching a new Watson-powered Internet of Things (IoT) service designed to help manufacturers streamline their assembly line inspection process. While Watson is used to process and ...

Borescopic visual inspection may be appropriate for small parts with areas not visible to the naked eye. Even with all the high-tech testing and inspection techniques in use today, basic visual ...

Want to learn more about the benefits of visual inspection - view the infographic https://www.slideshare.net/IBMIoT/the-power-of-cognitive-visual-inspection?ref=MIT ...

GE Digital today introduced a purpose-built Visual Intelligence Platform for utilities. The SaaS solution is designed to ingest all forms of visual inspection data and executes workflows and automated ...

Low-angle-of-light 3×-magnification VIU module enables visual inspection of seals. Quality assurance breaches such as pouch failures often occur because medical device manufacturers do not inspect and ...

As the core technology used in modern electronics manufacturing, surface-mount technology (SMT) assembly density is increasing, the number of pins is increasing, and the pitch is decreasing. In ...

WATERLOO, Ontario--(BUSINESS WIRE)--DarwinAI, an innovative Industry 4.0 company that is transforming manufacturing by instilling trust in Artificial Intelligence (AI), today announced a $6M USD ...

For a long time, semiconductor defect inspection focused on particles, and particle defects remain an important cause of yield loss. But as devices have become more complex, additional kinds of ...