TOKYO, Feb. 12, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the T5801 Ultra-High-Speed DRAM Test System. The cutting-edge ...
Recent surveys of working engineers in the electronics industry by the International Electronics Manufacturing Initiative (iNEMI) found that testing memory and memory buses on circuit boards is one of ...
STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...
May 15, 2012. Advantest Corp. has announced the availability of its next-generation high-speed DRAM test system, the T5511. Advantest says the new system, which begins shipping this month, offers the ...
The variety of different test methodologies combined with today�s mixture of memory devices creates a complex test profile. The manufacturing test floor hums with activity; a range of memory devices ...
A couple weeks ago, I was talking with a couple colleagues about DSLR cameras, and invariably the topic about high speed SD and CF memory cards came up. What we wanted to know is if a high speed ...
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